- All sections
- G - Physics
- G01R - Measuring electric variables; measuring magnetic variables
- G01R 31/26 - Testing of individual semiconductor devices
Patent holdings for IPC class G01R 31/26
Total number of patents in this class: 4723
10-year publication summary
|
445
|
343
|
306
|
349
|
293
|
314
|
286
|
291
|
267
|
88
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Advantest Corporation | 1939 |
244 |
| Texas Instruments Incorporated | 19376 |
128 |
| Samsung Electronics Co., Ltd. | 131630 |
121 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
108 |
| Tokyo Electron Limited | 11599 |
103 |
| Mitsubishi Electric Corporation | 43934 |
96 |
| Infineon Technologies AG | 8189 |
90 |
| International Business Machines Corporation | 60644 |
70 |
| SK Hynix Inc. | 11030 |
47 |
| Teradyne, Inc. | 579 |
45 |
| Samsung Display Co., Ltd. | 30585 |
43 |
| Intel Corporation | 45621 |
43 |
| Kabushiki Kaisha Nihon Micronics | 377 |
43 |
| Enplas Corporation | 900 |
41 |
| Hamamatsu Photonics K.K. | 4161 |
40 |
| Changxin Memory Technologies, Inc. | 4732 |
37 |
| Renesas Electronics Corporation | 6305 |
36 |
| Fuji Electric Co., Ltd. | 4750 |
36 |
| NHK Spring Co., Ltd. | 1657 |
36 |
| Robert Bosch GmbH | 40953 |
29 |
| Other owners | 3287 |